3D high-resolution mapping of polarization profiles in thin poly(Vinylidenefluoride-trifluoroethylene) (Pvdf-trfe) films using two thermal techniques

Cong Duc Pham, Anca Petre, Laurent Berquez, Rosaura Flores-Suárez, Axel Mellinger, Werner Wirges, Reimund Gerhard

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Abstract

In this paper, two non-destructive thermal methods are used in order to determine, with a high degree of accuracy, three-dimensional polarization distributions in thin films (12 μm) of poly(vinylidenefluoride- trifluoroethylene) (PVDF-TrFE). The techniques are the frequency-domain Focused Laser Intensity Modulation Method (FLIMM) and time-domain Thermal-Pulse Tomography (TPT). Samples were first metalized with grid-shaped electrode and poled. 3D polarization mapping yielded profiles which reproduce the electrode-grid shape. The polarization is not uniform across the sample thickness. Significant polarization values are found only at depths beyond 0.5 μm from the sample surface. Both methods provide similar results, TPT method being faster, whereas the FLIMM technique has a better lateral resolution.

Original languageEnglish
Article number5128505
Pages (from-to)676-681
Number of pages6
JournalIEEE Transactions on Dielectrics and Electrical Insulation
Volume16
Issue number3
DOIs
StatePublished - Jun 2009

Keywords

  • Dielectrics
  • FLIMM
  • Focused laser intensity modulation method
  • Polarization
  • Polymers
  • Space charges
  • TPT
  • Thermal pulse tomography

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