| Original language | English |
|---|---|
| Journal | IEEE Trans. Diel. Electr. Insul. |
| Volume | in press |
| State | Published - 2009 |
3D highresolution mapping of polarization profiles in thin poly(vinylidenefluoride-trifluoroethylene) (PVDF-TrFE) films using thermal techniques
C D Pham, Axel Peter Mellinger
Research output: Contribution to journal › Article › peer-review