Abstract
A new design for implementation of x-ray diffraction experiments is proposed. The exploitation of the imaging plate technique opens new possibilities to carry out diffraction experiments. The detector chamber in Debye-Scherrer geometry equipped with an image plate takes advantage of this technology such as high resolution, high sensitivity, linearity in intensity, and linearity over the detector area. The proof of this measurement principle is demonstrated by presentation of the x-ray diffraction pattern of corundum (crystalline), nickel (crystalline), and sodium borate (amorphous).
Original language | English |
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Pages (from-to) | 4007-4009 |
Number of pages | 3 |
Journal | Review of Scientific Instruments |
Volume | 71 |
Issue number | 11 |
DOIs | |
State | Published - Nov 2000 |