TY - GEN
T1 - Analysis of circular cluster tools
AU - Ahn, Younghun
AU - Morrison, James R.
PY - 2010
Y1 - 2010
N2 - A cluster tool consists of a collection of wafer processing chambers housed in a chassis about a wafer transport robot. Cluster tools are of increasing importance in semiconductor wafer manufacturing. While much effort has been focused on the modeling and optimization of such tools in steady state, less attention has been paid to transient modeling. It is anticipated that there will be smaller lot sizes, more product changeovers and an increase in setups brought about by the transition to 450mm wafer diameters and product customization. As such, transient behavior may become the norm rather than the exception. In this paper we conduct a rigorous analysis of the cycle time of wafers that includes transient behavior, diverse process times and robot movement. The results extend existing analyzes, provide justification of existing approximations and allow us to develop more expressive and simple approximations for the cycle time. The models, which include the robot as a resource, can be used to replace the common affine Ax+B tool model in fab level simulations. A study of the quality and computational complexity of various transient models is conducted.
AB - A cluster tool consists of a collection of wafer processing chambers housed in a chassis about a wafer transport robot. Cluster tools are of increasing importance in semiconductor wafer manufacturing. While much effort has been focused on the modeling and optimization of such tools in steady state, less attention has been paid to transient modeling. It is anticipated that there will be smaller lot sizes, more product changeovers and an increase in setups brought about by the transition to 450mm wafer diameters and product customization. As such, transient behavior may become the norm rather than the exception. In this paper we conduct a rigorous analysis of the cycle time of wafers that includes transient behavior, diverse process times and robot movement. The results extend existing analyzes, provide justification of existing approximations and allow us to develop more expressive and simple approximations for the cycle time. The models, which include the robot as a resource, can be used to replace the common affine Ax+B tool model in fab level simulations. A study of the quality and computational complexity of various transient models is conducted.
UR - http://www.scopus.com/inward/record.url?scp=78149435135&partnerID=8YFLogxK
U2 - 10.1109/COASE.2010.5584530
DO - 10.1109/COASE.2010.5584530
M3 - Conference contribution
AN - SCOPUS:78149435135
SN - 9781424454471
T3 - 2010 IEEE International Conference on Automation Science and Engineering, CASE 2010
SP - 39
EP - 44
BT - 2010 IEEE International Conference on Automation Science and Engineering, CASE 2010
Y2 - 21 August 2010 through 24 August 2010
ER -