Application of carbon nanotube AFM probes to the characterization of mesoporous materials

The introduction of the single-walled carbon nanotube (SWNT)-modified AFM probe tips that offer significant advantages over conventional SPM probes were discussed. SWNTs were grown on silicon oxide substrates by chemical vapor deposition using an iron catalyst. The substrates were allowed to cool in an argon atmosphere to room temperature. SWNTs were attached to the ends of the commercial AFM tips using the 'pick-up' method in which the tip is laterally scanned across the surface in the tapping mode. The AFM measurements were performed with a multimode atomic force microscope equipped with a Nanoscope III controller and operated in the tapping mode. The results show that SWNT-modified AFM tips would allow probing of the entire mesopore range and direct visualization of pore structures will contribute to a better understanding and control of the properties of porous materials at a nanometer level.