Atomic ordering in xZrO2 .(1-x)SiO2 xerogels (x=0.3,0.5) by X-ray diffraction and reverse Monte Carlo simulations

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)4209
JournalJ. Mat. Sci
Volume32
StatePublished - 1997

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