Atomic pair distribution functions analysis of disordered low-Z materials

V. Petkov, Y. Ren, S. Kabekkodu, D. Murphy

Research output: Contribution to journalArticlepeer-review

33 Scopus citations


Results of high-energy X-ray diffraction experiments coupled to atomic pair distribution function analysis of disordered low-Z materials are presented. Several scientifically and technologically important classes of disordered low-Z materials such as small and large organic molecules, graphitic powders, polymers and liquids are intentionally explored to certify the technique's performance. Results clearly show that disordered low-Z materials can be well characterized in terms of material's phase identity, relative abundance in mixtures and atomic-scale structure. The demonstrated efficiency of the technique provides the scientific community with much needed confidence to apply it more often than now.

Original languageEnglish
Pages (from-to)8544-8554
Number of pages11
JournalPhysical Chemistry Chemical Physics
Issue number22
StatePublished - Jun 14 2013


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