Breakdown field for dielectric barrier discharges in micrometer sized voids

Axel Peter Mellinger, Scott Matthew Harris

Research output: Contribution to conference › Abstract › peer-review

Original language	English
State	Published - Oct 2013
Event	2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Shenzhen, China Duration: Oct 1 2013 → Oct 31 2013

Conference	2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena
Period	10/1/13 → 10/31/13

Cite this

@conference{b32fadf378194beeb4d68af4efa56095,

title = "Breakdown field for dielectric barrier discharges in micrometer sized voids",

author = "Mellinger, {Axel Peter} and Harris, {Scott Matthew}",

year = "2013",

month = oct,

language = "English",

note = "2013 IEEE Conference on Electrical Insulation and Dielectric Phenomena ; Conference date: 01-10-2013 Through 31-10-2013",

}