Calibrating the thickness of metal thin films using AFM

Adam Jankovich, Axel Peter Mellinger, Scott Matthew Harris, Barbara Pavan, Minghui Chai

Research output: Contribution to conferencePoster

Original languageEnglish
StatePublished - Mar 2010
EventConference of the Americal Chemical Society - San Francisco
Duration: Mar 1 2010Mar 31 2010

Other

OtherConference of the Americal Chemical Society
Period03/1/1003/31/10

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