Electrochemical etching and characterization of sharp field emission points for electron impact ionization

Tyler L. Van Well; Matthew Redshaw; Nadeesha D. Gamage; R. M.Eranjan B. Kandegedara

doi:10.3791/54030

Electrochemical etching and characterization of sharp field emission points for electron impact ionization

Tyler L. Van Well, Matthew Redshaw, Nadeesha D. Gamage, R. M.Eranjan B. Kandegedara

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

A new variation of the drop-off method for fabricating field emission points by electrochemically etching tungsten rods in a NaOH solution is described. The results of studies in which the etching current and the molarity of the NaOH solution used in the etching process were varied are presented. The investigation of the geometry of the tips, by imaging them with a scanning electron microscope, and by operating them in field emission mode is also described. The field emission tips produced are intended to be used as an electron beam source for ion production via electron impact ionization of background gas or vapor in Penning trap mass spectrometry applications.

Original language	English
Article number	e54030
Journal	Journal of Visualized Experiments
Volume	2016
Issue number	113
DOIs	https://doi.org/10.3791/54030
State	Published - Jul 12 2016

Keywords

Cold Cathode Emitter
Electrochemical Etching
Electron Beam
Electron Impact Ionization
Engineering
Field Emission
Issue 113
Mass Spectrometry
Penning Trap

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title = "Electrochemical etching and characterization of sharp field emission points for electron impact ionization",

abstract = "A new variation of the drop-off method for fabricating field emission points by electrochemically etching tungsten rods in a NaOH solution is described. The results of studies in which the etching current and the molarity of the NaOH solution used in the etching process were varied are presented. The investigation of the geometry of the tips, by imaging them with a scanning electron microscope, and by operating them in field emission mode is also described. The field emission tips produced are intended to be used as an electron beam source for ion production via electron impact ionization of background gas or vapor in Penning trap mass spectrometry applications.",

keywords = "Cold Cathode Emitter, Electrochemical Etching, Electron Beam, Electron Impact Ionization, Engineering, Field Emission, Issue 113, Mass Spectrometry, Penning Trap",

author = "{Van Well}, {Tyler L.} and Matthew Redshaw and Gamage, {Nadeesha D.} and Kandegedara, {R. M.Eranjan B.}",

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T1 - Electrochemical etching and characterization of sharp field emission points for electron impact ionization

AU - Van Well, Tyler L.

AU - Redshaw, Matthew

AU - Gamage, Nadeesha D.

AU - Kandegedara, R. M.Eranjan B.

PY - 2016/7/12

Y1 - 2016/7/12

N2 - A new variation of the drop-off method for fabricating field emission points by electrochemically etching tungsten rods in a NaOH solution is described. The results of studies in which the etching current and the molarity of the NaOH solution used in the etching process were varied are presented. The investigation of the geometry of the tips, by imaging them with a scanning electron microscope, and by operating them in field emission mode is also described. The field emission tips produced are intended to be used as an electron beam source for ion production via electron impact ionization of background gas or vapor in Penning trap mass spectrometry applications.

AB - A new variation of the drop-off method for fabricating field emission points by electrochemically etching tungsten rods in a NaOH solution is described. The results of studies in which the etching current and the molarity of the NaOH solution used in the etching process were varied are presented. The investigation of the geometry of the tips, by imaging them with a scanning electron microscope, and by operating them in field emission mode is also described. The field emission tips produced are intended to be used as an electron beam source for ion production via electron impact ionization of background gas or vapor in Penning trap mass spectrometry applications.

KW - Cold Cathode Emitter

KW - Electrochemical Etching

KW - Electron Beam

KW - Electron Impact Ionization

KW - Engineering

KW - Field Emission

KW - Issue 113

KW - Mass Spectrometry

KW - Penning Trap

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U2 - 10.3791/54030

DO - 10.3791/54030

M3 - Article

C2 - 27500824

AN - SCOPUS:84979895390

VL - 2016

JO - Journal of Visualized Experiments

JF - Journal of Visualized Experiments

SN - 1940-087X

IS - 113

M1 - e54030

ER -

Electrochemical etching and characterization of sharp field emission points for electron impact ionization

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