Energy levels of charge traps in polyethylene terephthalate films

F. Camacho González, A. Mellinger, R. Gerhard-Multhaupt

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Photo-stimulated discharge (PSD) spectroscopy of polyethylene terephthalate (PETP) films charged through contacting electrodes was performed in order to investigate the mechanism(s) of charge storage and to determine trap depths. The samples were irradiated in vacuum with monochromatic light (photon energies of 3 - 6.2 eV) at constant temperature. The laser-intensity modulation method (LIMM) was used to determine the polarization and the space-charge distribution in the sample. Experimental results indicate the presence of one energy level at 4.1 eV and possibly a second energy level at 5.2 eV (300 and 240 nm, respectively).

Original languageEnglish
Title of host publicationProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Pages158-161
Number of pages4
StatePublished - 2004
EventProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, France
Duration: Jul 5 2004Jul 9 2004

Publication series

NameProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Volume1

Conference

ConferenceProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Country/TerritoryFrance
CityToulouse
Period07/5/0407/9/04

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