Fabrication and characterization of field emission points for ion production in Penning trap applications

Matthew Redshaw; Anne L. Benjamin; Georg Bollen; Rafael Ferrer; David L. Lincoln; Ryan Ringle; Stefan Schwarz; Adrian A. Valverde

doi:10.1016/j.ijms.2015.01.006

Fabrication and characterization of field emission points for ion production in Penning trap applications

Matthew Redshaw, Anne L. Benjamin, Georg Bollen, Rafael Ferrer, David L. Lincoln, Ryan Ringle, Stefan Schwarz, Adrian A. Valverde

Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described.

Original language	English
Pages (from-to)	187-193
Number of pages	7
Journal	International Journal of Mass Spectrometry
Volume	379
DOIs	https://doi.org/10.1016/j.ijms.2015.01.006
State	Published - Mar 15 2015

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10.1016/j.ijms.2015.01.006

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title = "Fabrication and characterization of field emission points for ion production in Penning trap applications",

abstract = "A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described.",

author = "Matthew Redshaw and Benjamin, {Anne L.} and Georg Bollen and Rafael Ferrer and Lincoln, {David L.} and Ryan Ringle and Stefan Schwarz and Valverde, {Adrian A.}",

note = "Funding Information: We would like to thank Stanley Flegler, Carol Flegler, and Abigail Tirrell at the MSU Center for Advanced Microscopy for SEM imaging services, and John Yurkon for assistance with the set-up of the electrochemical etching apparatus. This work was supported by the National Science Foundation under contract no. PHY-1102511. Publisher Copyright: {\textcopyright} 2015 Elsevier B.V.",

year = "2015",

month = mar,

day = "15",

doi = "10.1016/j.ijms.2015.01.006",

language = "English",

volume = "379",

pages = "187--193",

journal = "International Journal of Mass Spectrometry",

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publisher = "International Journal of Mass Spectrometry",

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TY - JOUR

T1 - Fabrication and characterization of field emission points for ion production in Penning trap applications

AU - Redshaw, Matthew

AU - Benjamin, Anne L.

AU - Bollen, Georg

AU - Ferrer, Rafael

AU - Lincoln, David L.

AU - Ringle, Ryan

AU - Schwarz, Stefan

AU - Valverde, Adrian A.

N1 - Funding Information: We would like to thank Stanley Flegler, Carol Flegler, and Abigail Tirrell at the MSU Center for Advanced Microscopy for SEM imaging services, and John Yurkon for assistance with the set-up of the electrochemical etching apparatus. This work was supported by the National Science Foundation under contract no. PHY-1102511. Publisher Copyright: © 2015 Elsevier B.V.

PY - 2015/3/15

Y1 - 2015/3/15

N2 - A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described.

AB - A series of cold cathode field emission points to be used for electron impact ionization of background gas in Penning trap mass spectrometry applications have been fabricated by electrochemically etching tungsten rod in a NaOH solution. A new variation of the drop-off etching method that can produce tips with tip radii down to 10 nm is described. We present the results of studies in which the parameters used in the etching process were varied, and the geometry and operation of the resulting tips was investigated by imaging them with a scanning electron microscope and by operating them in field emission mode. Finally, the use of these tips in a Penning trap mass spectrometry application is described.

UR - http://www.scopus.com/inward/record.url?scp=84939976031&partnerID=8YFLogxK

U2 - 10.1016/j.ijms.2015.01.006

DO - 10.1016/j.ijms.2015.01.006

M3 - Article

AN - SCOPUS:84939976031

VL - 379

SP - 187

EP - 193

JO - International Journal of Mass Spectrometry

JF - International Journal of Mass Spectrometry

SN - 1387-3806

ER -

Fabrication and characterization of field emission points for ion production in Penning trap applications

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