First principles derivation of microcavity semiconductor laser threshold condition and its application to FDTD active cavity modeling

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Cite this

@article{8aa70279222e4127b32efe2356392bbf,

title = "First principles derivation of microcavity semiconductor laser threshold condition and its application to FDTD active cavity modeling",

author = "Mock, {Adam P}",

year = "2010",

month = oct,

language = "English",

volume = "27",

pages = "2262--2272",

journal = "Default journal",

number = "11",

}