High-real space resolution measurement of the local structure of InxGa 1-xAs semiconductor alloys using X-ray diffraction

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Cite this

@article{ef6c2b3aec284507ae88d7a634aa6fcd,

title = "High-real space resolution measurement of the local structure of InxGa 1-xAs semiconductor alloys using X-ray diffraction",

author = "I-K Jeong and Petkov, {Valeri Gueorguiev}",

year = "1999",

language = "English",

volume = "83",

pages = "4089",

journal = "Phys. Rev. Lett",

publisher = "Phys. Rev. Lett",

}