High-resolution atomic distribution functions of disordered materials by high-energy X-ray diffraction

V. Petkov, S. J.L. Billinge, S. D. Shastri, B. Himmel

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26 Scopus citations

Abstract

The atomic-scale structure of materials with different degrees of structural disorder has been investigated by high-energy (E≥60keV) X-ray diffraction. Good quality structure functions extended to wave vectors of magnitude Q≥40Å-1 have been obtained even in case of materials composed of weakly scattering, light atomic species. The corresponding high-resolution atomic distribution functions allowed fine structural features differing in as little as (0.14 Å) to be resolved. In particular, the distinct Ga-As (∼2.43 Å) and In-As (2.61 Å) bonds in In-Ga-As alloys have been differentiated. The atomic-scale structure of 'restacked' WS2 has been determined and the presence of three distinct W-W distances occurring at 2.77, 3.27 and 3.85 Å established. Finally, Si-O (∼1.61 Å), Al-O (∼1.75 Å) and Ca-O (∼2.34 Å) bonds in calcium aluminosilicate glasses have been differentiated and the characteristics of the respective co-ordination polyhedra revealed.

Original languageEnglish
Pages (from-to)726-730
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume293-295
Issue number1
DOIs
StatePublished - Nov 2001
Event8th International Conference on Non-Cristalline Materials (NCM-8) - Aberystwyth, United Kingdom
Duration: Aug 6 2000Aug 11 2000

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