@inproceedings{8f188c241bff472a99fd511e11388f6f,
title = "Investigation of charge trapping in thin Kapton{\textregistered} polyimide films by means of photo-stimulated discharge spectroscopy",
abstract = "Photo-stimulated discharge-current spectroscopy was performed on 50 μm Kapton{\textregistered} 200HN polyimide thermo- and photoelectrets formed in the temperature range between -40°C and +130°C. Films were either charged in the DC electric field of 20 MV/m or photo-charged by illumination with light at the wavelength of 420 nm under the electric field of the same strength. Photocurrent spectra scanned in the wavelength interval 600-350 nm demonstrate a pronounced peak at approximately 470 nm revealing the presence of one charge-trapping level. The long-wavelength cut-off of the peak is at 550 nm corresponding to 2.3 eV trap depth.",
keywords = "Charge-trapping levels, Discharge-current spectroscopy, Kapton{\textregistered} polyimide, Photo-stimulated discharge",
author = "Nika Kozhevnikova and Reimund Gerhard and Axel Mellinger",
year = "2010",
doi = "10.1109/ICSD.2010.5567942",
language = "English",
isbn = "9781424479443",
series = "Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010",
booktitle = "Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010",
note = "null ; Conference date: 04-07-2010 Through 09-07-2010",
}