Low-Cost Low-Power Self-Test Design and Verification for On-Chip ADC in System-On-a-Chip Applications

V Chandrasekhar, Kumar Yelamarthi

Research output: Other contribution › peer-review

Original language	English
Publisher	IEEE Instrumentation and Measurement Technology Conference
State	Published - Apr 2006

Cite this

@misc{d5ab32d5842142319c362bf051eacebf,

title = "Low-Cost Low-Power Self-Test Design and Verification for On-Chip ADC in System-On-a-Chip Applications",

author = "V Chandrasekhar and Kumar Yelamarthi",

year = "2006",

month = apr,

language = "English",

publisher = "IEEE Instrumentation and Measurement Technology Conference",

type = "Other",

}