TY - JOUR
T1 - Making use of semiconductor manufacturing process variations
T2 - FinFET-based physical unclonable functions for efficient security integration in the IoT
AU - Yanambaka, Venkata P.
AU - Mohanty, Saraju P.
AU - Kougianos, Elias
N1 - Funding Information:
a Professor at the Department of Computer Science and Engi- neering (CSE), University of North Texas (UNT), where he directs the NanoSystem Design Laboratory (NSDL). He obtained a Ph.D. in Computer Engineering from the University of South Florida (USF) in 2003, a Master’s degree in Systems Science and Automation (SSA) from the Indian Institute of Science (IISc), Bangalore, India in 1999, and a Bachelor’s degree (Honors) in Electrical Engineering from Orissa University of Agriculture and Technology (OUAT), Bhubaneswar, India in 1995. Prof. Mohanty’s research is in ‘‘Energy-Efficient High-Performance Secure Electronic Systems’’. Prof. Mohanty’s research has been funded by National Science Foundation (NSF), Semiconductor Research Corporation (SRC), and Air Force. Dr. Mohanty is an inventor of 4 US patents. Prof. Mohanty is an author of 220 peer-reviewed journal and conference articles, and 3 books. His Google Scholar h-index is 27 and i10-index is 80. Prof. Mohanty was conferred the Glorious India Award in 2017 for his exemplary contributions to the discipline. He received Society for Technical Communication (STC) 2017 Award of Merit for his outstanding contributions to IEEE Consumer Electronics Magazine. He was the recipient of 2016 PROSE Award for best Textbook in Physical Sciences & Mathematics from the Association of American Publishers for his book titled ‘‘Nanoelectronic Mixed-Signal System Design’’ published by McGraw-Hill in 2015. He was conferred 2016–2017 UNT Toulouse Scholars Award for sustained excellent scholarship and teaching achievements. Prof. Mohanty has been serving on the editorial board of several peer-reviewed international journals or transactions. He currently serves on the editorial board of 6 peer-reviewed international journals, including IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) and ACM Journal on Emerging Technologies in Computing Systems (JETC). He is currently the Editor-in-Chief (EiC) of the IEEE Consumer Electronics Magazine. Prof. Mohanty currently serves as the Chair of Technical Committee on Very Large Scale Integration (TCVLSI), IEEE Computer Society (IEEE-CS) to oversee a dozen of IEEE conferences. He serves on the steering, organizing, and program committees of several international conferences. Prof. Mohanty has supervised 8 Ph.D. dissertations and 26 M.S. theses; eight of these advisees have received outstanding student awards at UNT. He has received Honors Day recognition as an inspirational faculty at the UNT for multiple years. He has also received UNT Provost’s Thank a Teacher recognition for multiple years. More about his biography, research, education, and outreach activities can be obtained from his website: http://www.smohanty.org.
Publisher Copyright:
© 2017, Springer Science+Business Media, LLC.
PY - 2017/12/1
Y1 - 2017/12/1
N2 - In a typical design environment, semiconductor manufacturing variations are considered as challenges for nanoelectronic circuit design engineers. This has led to multi-front research on process variations analysis and its mitigations. As a paradigm shift of that trend the present article explores the use of semiconductor manufacturing variations for enhancing security of systems using FinFET technology as an example. FinFETs were introduced to replace high-κ transistors in nanoelectronic applications. From microprocessors to graphic processing units, FinFETs are being used commercially today. Along with the technological advancements in computing and networking, the number of cyber attacks has also increased. Simultaneously, numerous implementations of the Internet of Things are already present. In this environment, one small security flaw is enough to place the entire network in danger. Encrypting communications in such an environment is vital. Physical unclonable functions (PUFs) can be used to encrypt device to device communications and are the main focus of this paper. PUFs are hardware primitives which rely on semiconductor manufacturing variations to generate characteristics which are used for this purpose. Two different designs of a ring oscillator PUF are introduced, one with low power consumption trading off device performance and one high-performance trading off device power consumption. There is an 11% decrease in power consumption with the low power model along with a simple design and fabrication. Performance of the device can be increased with almost no increase in power consumption.
AB - In a typical design environment, semiconductor manufacturing variations are considered as challenges for nanoelectronic circuit design engineers. This has led to multi-front research on process variations analysis and its mitigations. As a paradigm shift of that trend the present article explores the use of semiconductor manufacturing variations for enhancing security of systems using FinFET technology as an example. FinFETs were introduced to replace high-κ transistors in nanoelectronic applications. From microprocessors to graphic processing units, FinFETs are being used commercially today. Along with the technological advancements in computing and networking, the number of cyber attacks has also increased. Simultaneously, numerous implementations of the Internet of Things are already present. In this environment, one small security flaw is enough to place the entire network in danger. Encrypting communications in such an environment is vital. Physical unclonable functions (PUFs) can be used to encrypt device to device communications and are the main focus of this paper. PUFs are hardware primitives which rely on semiconductor manufacturing variations to generate characteristics which are used for this purpose. Two different designs of a ring oscillator PUF are introduced, one with low power consumption trading off device performance and one high-performance trading off device power consumption. There is an 11% decrease in power consumption with the low power model along with a simple design and fabrication. Performance of the device can be increased with almost no increase in power consumption.
KW - Encryption
KW - FinFET
KW - Internet of Things (IoT)
KW - Physical unclonable function (PUF)
KW - Process variation
KW - Security
UR - http://www.scopus.com/inward/record.url?scp=85030706333&partnerID=8YFLogxK
U2 - 10.1007/s10470-017-1053-9
DO - 10.1007/s10470-017-1053-9
M3 - Article
AN - SCOPUS:85030706333
VL - 93
SP - 429
EP - 441
JO - Analog Integrated Circuits and Signal Processing
JF - Analog Integrated Circuits and Signal Processing
SN - 0925-1030
IS - 3
ER -