Rapid structure determination of disordered materials: Study of GeSe 2 glass

V. Petkov, D. Qadir, S. D. Shastri

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

X-ray diffraction experiments on GeSe2 glass employing an Imaging Plate detector system have been carried out and their performance compared to that of traditional experiments employing point-type detectors. Imaging Plate detectors have been found to perform very well delivering good quality data for just a second. The analysis of the experimental data shows that the atomic ordering in GeSe2 glass bears many of the characteristics of a random network of Ge-Se4 tetrahedra.

Original languageEnglish
Pages (from-to)239-243
Number of pages5
JournalSolid State Communications
Volume129
Issue number4
DOIs
StatePublished - Jan 2004

Keywords

  • A. GeSe
  • C. Glass structure
  • C. X-ray scattering

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