TY - GEN
T1 - Regular flow line models for semiconductor cluster tools
T2 - 2009 IEEE International Conference on Automation Science and Engineering, CASE 2009
AU - Morrison, James R.
PY - 2009
Y1 - 2009
N2 - We develop a reduced complexity recursion for the wafer delay in each server in flow lines with wafer dependent deterministic or regular process times and demonstrate how it can serve to model lot production in semiconductor cluster tools with setups. Under certain assumptions on the process times, it is shown that the system behavior shares some similarities with the case of wafer independent process times, thereby enabling our results. Such models can be used to substantially increase the fidelity of existing fabricator simulation models, without the computational complexity of a complete step-by-step wafer, module and robot simulation. The models have been tested using data from a clustered photolithography tool in production and exhibited throughput and tool sojourn time values within 1% and 4% of the actual values, respectively.
AB - We develop a reduced complexity recursion for the wafer delay in each server in flow lines with wafer dependent deterministic or regular process times and demonstrate how it can serve to model lot production in semiconductor cluster tools with setups. Under certain assumptions on the process times, it is shown that the system behavior shares some similarities with the case of wafer independent process times, thereby enabling our results. Such models can be used to substantially increase the fidelity of existing fabricator simulation models, without the computational complexity of a complete step-by-step wafer, module and robot simulation. The models have been tested using data from a clustered photolithography tool in production and exhibited throughput and tool sojourn time values within 1% and 4% of the actual values, respectively.
UR - http://www.scopus.com/inward/record.url?scp=70449122721&partnerID=8YFLogxK
U2 - 10.1109/COASE.2009.5234135
DO - 10.1109/COASE.2009.5234135
M3 - Conference contribution
AN - SCOPUS:70449122721
SN - 9781424445783
T3 - 2009 IEEE International Conference on Automation Science and Engineering, CASE 2009
SP - 561
EP - 566
BT - 2009 IEEE International Conference on Automation Science and Engineering, CASE 2009
Y2 - 22 August 2009 through 25 August 2009
ER -