Abstract
Sharp rigid to floppy phase transition induced by dangling ends in a network glass was analyzed using Raman scattering and first-principles cluster calculations. The glass transition temperature was measured at 1°C/100 s modulation rate and 3°C/min scan rate using modulated scanning calorimetry (MDSC). The results show the growth of a self-organized intermediate phase between the floppy and stressed rigid phases in a silicon glasses.
Original language | English |
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Article number | 185503 |
Pages (from-to) | 1855031-1855034 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 87 |
Issue number | 18 |
State | Published - Oct 29 2001 |