Sharp rigid to floppy phase transition induced by dangling ends in a network glass

Y. Wang, J. Wells, D. G. Georgiev, P. Boolchand, Koblar Jackson, M. Micoulaut

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78 Scopus citations

Abstract

Sharp rigid to floppy phase transition induced by dangling ends in a network glass was analyzed using Raman scattering and first-principles cluster calculations. The glass transition temperature was measured at 1°C/100 s modulation rate and 3°C/min scan rate using modulated scanning calorimetry (MDSC). The results show the growth of a self-organized intermediate phase between the floppy and stressed rigid phases in a silicon glasses.

Original languageEnglish
Article number185503
Pages (from-to)1855031-1855034
Number of pages4
JournalPhysical Review Letters
Volume87
Issue number18
StatePublished - Oct 29 2001

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