TY - GEN
T1 - Space charge build-up in tubular channel ferroelectrets
AU - Nepal, Neerajan
AU - Mellinger, Axel
AU - Altafim, Ruy Alberto Pisani
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/12/15
Y1 - 2016/12/15
N2 - The charge deposition process in tubular channel ferroelectrets, (i. e. voided FEP polymer films with internal electric charges) has been studied using a combination of near-UV fluorescence light emission imaging and non-destructive space charge measurements with the laser intensity modulation method (LIMM). By galvanically isolating the diode laser from the detection circuit, the LIMM sensitivity was improved by nearly one order of magnitude. It was shown that the onset of light emission as a function of charging voltage precisely correlates with the deposition of space charge. This confirms previous studies where the presence of space charge was indirectly detected from the sample's piezoelectric properties.
AB - The charge deposition process in tubular channel ferroelectrets, (i. e. voided FEP polymer films with internal electric charges) has been studied using a combination of near-UV fluorescence light emission imaging and non-destructive space charge measurements with the laser intensity modulation method (LIMM). By galvanically isolating the diode laser from the detection circuit, the LIMM sensitivity was improved by nearly one order of magnitude. It was shown that the onset of light emission as a function of charging voltage precisely correlates with the deposition of space charge. This confirms previous studies where the presence of space charge was indirectly detected from the sample's piezoelectric properties.
UR - http://www.scopus.com/inward/record.url?scp=85009801451&partnerID=8YFLogxK
U2 - 10.1109/CEIDP.2016.7785501
DO - 10.1109/CEIDP.2016.7785501
M3 - Conference contribution
AN - SCOPUS:85009801451
T3 - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
SP - 388
EP - 391
BT - 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 16 October 2016 through 19 October 2016
ER -