Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

V. Petkov, M. Gateshki, J. Choi, E. G. Gillan, Y. Ren

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

The three-dimensional structure of nanocrystalline GaN has been studied by X-ray diffraction, Rietveld and atomic pair distribution function (PDF) analyses. The material is of very limited structural coherence, yet possess a well-defined atomic arrangement resembling the wurtzite structure. The study demonstrates the great power of X-ray diffraction and the PDF approach in determining the three-dimensional structure of nanocrystalline materials.

Original languageEnglish
Pages (from-to)4654-4659
Number of pages6
JournalJournal of Materials Chemistry
Volume15
Issue number43
DOIs
StatePublished - Nov 21 2005

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