Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

V. Petkov; M. Gateshki; J. Choi; E. G. Gillan; Y. Ren

doi:10.1039/b509577h

Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

V. Petkov, M. Gateshki, J. Choi, E. G. Gillan, Y. Ren

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Abstract

The three-dimensional structure of nanocrystalline GaN has been studied by X-ray diffraction, Rietveld and atomic pair distribution function (PDF) analyses. The material is of very limited structural coherence, yet possess a well-defined atomic arrangement resembling the wurtzite structure. The study demonstrates the great power of X-ray diffraction and the PDF approach in determining the three-dimensional structure of nanocrystalline materials.

Original language	English
Pages (from-to)	4654-4659
Number of pages	6
Journal	Journal of Materials Chemistry
Volume	15
Issue number	43
DOIs	https://doi.org/10.1039/b509577h
State	Published - Nov 21 2005

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@article{6efd8904820349159046d9b509816162,

title = "Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses",

abstract = "The three-dimensional structure of nanocrystalline GaN has been studied by X-ray diffraction, Rietveld and atomic pair distribution function (PDF) analyses. The material is of very limited structural coherence, yet possess a well-defined atomic arrangement resembling the wurtzite structure. The study demonstrates the great power of X-ray diffraction and the PDF approach in determining the three-dimensional structure of nanocrystalline materials.",

author = "V. Petkov and M. Gateshki and J. Choi and Gillan, {E. G.} and Y. Ren",

year = "2005",

month = nov,

day = "21",

doi = "10.1039/b509577h",

language = "English",

volume = "15",

pages = "4654--4659",

journal = "Journal of Materials Chemistry",

issn = "0959-9428",

number = "43",

}

TY - JOUR

T1 - Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

AU - Petkov, V.

AU - Gateshki, M.

AU - Choi, J.

AU - Gillan, E. G.

AU - Ren, Y.

PY - 2005/11/21

Y1 - 2005/11/21

N2 - The three-dimensional structure of nanocrystalline GaN has been studied by X-ray diffraction, Rietveld and atomic pair distribution function (PDF) analyses. The material is of very limited structural coherence, yet possess a well-defined atomic arrangement resembling the wurtzite structure. The study demonstrates the great power of X-ray diffraction and the PDF approach in determining the three-dimensional structure of nanocrystalline materials.

AB - The three-dimensional structure of nanocrystalline GaN has been studied by X-ray diffraction, Rietveld and atomic pair distribution function (PDF) analyses. The material is of very limited structural coherence, yet possess a well-defined atomic arrangement resembling the wurtzite structure. The study demonstrates the great power of X-ray diffraction and the PDF approach in determining the three-dimensional structure of nanocrystalline materials.

UR - http://www.scopus.com/inward/record.url?scp=27944502598&partnerID=8YFLogxK

U2 - 10.1039/b509577h

DO - 10.1039/b509577h

M3 - Article

AN - SCOPUS:27944502598

VL - 15

SP - 4654

EP - 4659

JO - Journal of Materials Chemistry

JF - Journal of Materials Chemistry

SN - 0959-9428

IS - 43

ER -

Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

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