TY - JOUR
T1 - The throughput rate of serial production lines with deterministic process times and random setups
T2 - Markovian models and applications to semiconductor manufacturing
AU - Kim, Woo Sung
AU - Morrison, James R.
N1 - Publisher Copyright:
© 2014 Elsevier B.V. All rights reserved.
PY - 2015/1
Y1 - 2015/1
N2 - We conduct exact analysis of serial production lines with deterministic service durations and various classes of random state-dependent setups between customers. Our focus is on assessing the production rate, or just-in-time (JIT) throughput. We demonstrate that such systems can be modeled as a Markov chain and consider various types of setups inspired by clustered photolithography tools in semiconductor manufacturing. We deduce when exact closed form expressions for the production rate are possible and when a numeric solution to the Markov chain balance equations are required. As these systems have shown promise for modeling process bound clustered photolithography tools, we study their accuracy versus detailed simulation for predicting the tool throughput. Various practical features such as the capacity of a pre-scan buffer and batch customers (to model wafer lots) are investigated.
AB - We conduct exact analysis of serial production lines with deterministic service durations and various classes of random state-dependent setups between customers. Our focus is on assessing the production rate, or just-in-time (JIT) throughput. We demonstrate that such systems can be modeled as a Markov chain and consider various types of setups inspired by clustered photolithography tools in semiconductor manufacturing. We deduce when exact closed form expressions for the production rate are possible and when a numeric solution to the Markov chain balance equations are required. As these systems have shown promise for modeling process bound clustered photolithography tools, we study their accuracy versus detailed simulation for predicting the tool throughput. Various practical features such as the capacity of a pre-scan buffer and batch customers (to model wafer lots) are investigated.
KW - Clustered photolithography tools
KW - Flow line
KW - Semiconductor manufacturing
KW - Serial production line
KW - Tandem queues
UR - http://www.scopus.com/inward/record.url?scp=84912102087&partnerID=8YFLogxK
U2 - 10.1016/j.cor.2014.03.022
DO - 10.1016/j.cor.2014.03.022
M3 - Article
AN - SCOPUS:84912102087
SN - 0305-0548
VL - 53
SP - 288
EP - 300
JO - Computers and Operations Research
JF - Computers and Operations Research
ER -