Three-dimensional thermal-pulse probing of polarization profiles with low thermal stress

S. Aryal, D. C. Simon, A. Mellinger

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations

Abstract

Thermal-pulse tomography (TPT) has been shown to be a valuable tool for non-destructively measuring three-dimensional electrical polarization and space-charge distributions in electret polymers. However, one of its drawbacks is the high thermal stress imposed on the sample surface when short pulses of laser light are focused to a tight spot. Q-switched Nd:YAG lasers, which are frequently used as heat source in TPT experiments, have a pulse duration of approximately 5 ns. However, due to bandwidth limitations of the amplifier circuits, the stimulating heat pulse can be as long as a few μs without significant loss of depth resolution. Recently, high-power diode lasers have become available that can be electrically driven to provide light pulses of the desired length. The longer light pulses from the diode laser have a significantly lower peak power density, thus avoiding ablation damage to the electrode, even at higher pulse energies. We present spatially resolved polarization maps of poly(vinylidene-trifluoroethylene) samples showing the significantly enhanced signal-to noise ratio of the upgraded instrument.

Original languageEnglish
Article number6378766
Pages (from-to)243-246
Number of pages4
JournalAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
DOIs
StatePublished - 2012
Event2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2012 - Montreal, QC, Canada
Duration: Oct 14 2012Oct 17 2012

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