Three-Dimensional Thermal-Pulse Probing of Polarization Profiles with Low Thermal Stress

Daniel C Simon, Axel Peter Mellinger, Saurav Aryal

Research output: Contribution to conference › Poster › peer-review

Original language	English
State	Published - Oct 15 2012
Event	2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Montreal, QC, Canada Duration: Oct 15 2012 → Oct 15 2012

Conference	2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena
Period	10/15/12 → 10/15/12

Cite this

@conference{26097801e8324caeb7ffc1c8c19b5340,

title = "Three-Dimensional Thermal-Pulse Probing of Polarization Profiles with Low Thermal Stress",

author = "Simon, {Daniel C} and Mellinger, {Axel Peter} and Saurav Aryal",

year = "2012",

month = oct,

day = "15",

language = "English",

note = "2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena ; Conference date: 15-10-2012 Through 15-10-2012",

}