Timing Optimization and Noise Tolerance for Dynamic CMOS Susceptible to Process Variations

Kumar Yelamarthi, Chien-In Henry Chen

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)255-265
JournalIEEE Transactions on Semiconductor Manufacturing
Volume25
Issue number2
StatePublished - May 2012

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