Original language | English |
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Pages (from-to) | 255-265 |
Journal | IEEE Transactions on Semiconductor Manufacturing |
Volume | 25 |
Issue number | 2 |
State | Published - May 2012 |
Timing Optimization and Noise Tolerance for Dynamic CMOS Susceptible to Process Variations
Kumar Yelamarthi, Chien-In Henry Chen
Research output: Contribution to journal › Article › peer-review