Two-and three-dimensional analysis of polarization profiles in electret materials with thermal pulses

Saurav Aryal, Axel Mellinger

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

Three-dimensional polarization distributions in thin electret films can be measured non-destructively using the thermal-pulse technique and the Laser Intensity Modulation Method (LIMM). However, the task of calculating the polarization distribution from the experimentally measured electric current is an ill-posed problem and requires special deconvolution techniques. While the analysis of one-dimensional sample geometries is well understood, there has been no such solution for the two- and the three-dimensional cases. In the past, thermal-pulse experiments have therefore been analyzed using the established one-dimensional techniques, thus sacrificing lateral resolution. In this work, the current signal from several neighboring spots along a scan line is coupled together, and a Monte Carlo method is used for the deconvolution. Preliminary results show that lateral polarization discontinuities are more accurately reproduced with the new approach, resulting in a higher lateral resolution.

Original languageEnglish
Article number6232642
Pages (from-to)243-246
Number of pages4
JournalAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
DOIs
StatePublished - 2011
Event2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2011 - Cancun, Mexico
Duration: Oct 16 2011Oct 19 2011

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